TY  - RPRT
TI  - Analytical method for parameterizing the random profile components of nanosurfaces imaged by atomic force microscopy
AU  - Utkur Mirsaidov
AU  - Serge F. Timashev
AU  - Yuriy S. Polyakov
AU  - Pavel I. Misurkin
AU  - Ibrahim Musaev
AU  - Sergey V. Polyakov
PY  - 2010
DO  - 10.1039/c0an00498g
UR  - https://arxiv.org/abs/1010.6232
ID  - 1010.6232
ER  -