TY  - RPRT
TI  - Charged basal stacking fault (BSF) scattering in nitride semiconductors
AU  - Aniruddha Konar
AU  - Tian Fang
AU  - Nan Sun
AU  - Debdeep Jena
PY  - 2010
DO  - 10.1063/1.3543846
UR  - https://arxiv.org/abs/1011.0514
ID  - 1011.0514
ER  -