TY  - RPRT
TI  - Identification of the major cause of endemically poor mobilities in SiC/SiO2 structures
AU  - Xiao Shen
AU  - Sokrates T. Pantelides
PY  - 2010
DO  - 10.1063/1.3553786
UR  - https://arxiv.org/abs/1011.2820
ID  - 1011.2820
ER  -