TY  - RPRT
TI  - Full 3D Quantum Transport Simulation of Atomistic Interface Roughness in Silicon Nanowire FETs
AU  - SungGeun Kim
AU  - Abhijeet Paul
AU  - Mathieu Luisier
AU  - Timothy B. Boykin
AU  - Gerhard Klimeck
PY  - 2011
DO  - 10.1109/ted.2011.2118213
UR  - https://arxiv.org/abs/1011.3285
ID  - 1011.3285
ER  -