TY  - RPRT
TI  - Multiscale Metrology and Optimization of Ultra-Scaled InAs Quantum Well FETs
AU  - Neerav Kharche
AU  - Gerhard Klimeck
AU  - Dae-Hyun Kim
AU  - Jesús. A. del Alamo
AU  - Mathieu Luisier
PY  - 2010
DO  - 10.1109/ted.2011.2144986
UR  - https://arxiv.org/abs/1012.0536
ID  - 1012.0536
ER  -