@misc{indiciae6940c9fde96b,
  title = {Intrinsic Reliability improvement in Biaxially Strained SiGe p-MOSFETs},
  author = {Shweta Deora and Abhijeet Paul and R. Bijesh and Jeff Huang and Gerhard Klimeck and Gennadi Bersuker and P. D. Krisch and Raj Jammy},
  year = {2010},
  doi = {10.1109/led.2010.2099101},
  url = {https://arxiv.org/abs/1012.1579},
  note = {Source identifier: 1012.1579}
}