TY  - RPRT
TI  - Threshold concentration for H blistering in defect free W
AU  - W. Xiao
AU  - G. -N. Luo
AU  - W. T. Geng
PY  - 2011
DO  - 10.1016/j.jnucmat.2011.09.019
UR  - https://arxiv.org/abs/1101.2939
ID  - 1101.2939
ER  -