TY  - RPRT
TI  - Modeling microstructure noise with mutually exciting point processes
AU  - E. Bacry
AU  - S. Delattre
AU  - M. Hoffmann
AU  - J. F. Muzy
PY  - 2011
UR  - https://arxiv.org/abs/1101.3422
ID  - 1101.3422
ER  -