TY  - RPRT
TI  - Evaluation of a gate capacitance in the sub-aF range for a chemical field-effect transistor with a silicon nanowire channel
AU  - Nicolas Clement
AU  - Katsuhiko Nishiguchi
AU  - Akira Fujiwara
AU  - Dominique Vuillaume
PY  - 2011
DO  - 10.1109/tnano.2011.2123913
UR  - https://arxiv.org/abs/1101.4088
ID  - 1101.4088
ER  -