TY  - RPRT
TI  - Transition Edge Sensor Thermometry for On-chip Materials Characterization
AU  - D. J. Goldie
AU  - D. M. Glowacka
AU  - K. Rostem†and S. Withington
PY  - 2011
UR  - https://arxiv.org/abs/1101.5916
ID  - 1101.5916
ER  -