TY  - RPRT
TI  - Quantitative modeling of \textit{in situ} x-ray reflectivity during organic molecule thin film growth
AU  - Arthur R. Woll
AU  - Tushar V. Desai
AU  - James R. Engstrom
PY  - 2011
DO  - 10.1103/physrevb.84.075479
UR  - https://arxiv.org/abs/1102.2676
ID  - 1102.2676
ER  -