TY  - RPRT
TI  - Robust surface electronic properties of topological insulators: Bi2Te3 films grown by molecular beam epitaxy
AU  - L. Plucinski
AU  - G. Mussler
AU  - J. Krumrain
AU  - S. Suga
AU  - D. Gruetzmacher
AU  - C. M. Schneider
PY  - 2011
DO  - 10.1063/1.3595309
UR  - https://arxiv.org/abs/1103.4548
ID  - 1103.4548
ER  -