TY  - RPRT
TI  - Thickness-dependent bulk properties and weak anti-localization effect in topological insulator Bi2Se3
AU  - Yong Seung Kim
AU  - Matthew Brahlek
AU  - Namrata Bansal
AU  - Eliav Edrey
AU  - Gary A. Kapilevich
AU  - Keiko Iida
AU  - Makoto Tanimura
AU  - Yoichi Horibe
AU  - Sang-Wook Cheong
AU  - Seongshik Oh
PY  - 2011
DO  - 10.1103/physrevb.84.073109
UR  - https://arxiv.org/abs/1104.0913
ID  - 1104.0913
ER  -