TY  - RPRT
TI  - A Backscattering Model Incorporating the Effective Carrier Temperature in Nano MOSFET
AU  - Gino Giusi
AU  - Giuseppe Iannaccone
AU  - Felice Crupi
AU  - Umberto Ravaioli
PY  - 2011
DO  - 10.1109/led.2011.2145352
UR  - https://arxiv.org/abs/1104.3144
ID  - 1104.3144
ER  -