TY  - RPRT
TI  - High purity semi-insulating 4H-SiC epitaxial layers by Defect-Competition Epitaxy
AU  - MVS Chandrashekhar
AU  - Iftekhar Chowdhury
AU  - P. Kaminski
AU  - R. Kozlowski
AU  - P. B. Klein
AU  - Tangali Sudarshan
PY  - 2011
DO  - 10.1143/apex.5.025502
UR  - https://arxiv.org/abs/1104.4509
ID  - 1104.4509
ER  -