TY  - RPRT
TI  - Nanoscale structure and mechanism for enhanced electromechanical response of highly-strained BiFeO3 thin films
AU  - A. R. Damodaran
AU  - C. -W. Liang
AU  - Q. He
AU  - C. -Y. Peng
AU  - L. Chang
AU  - Y. -H. Chu
AU  - L. W. Martin
PY  - 2011
UR  - https://arxiv.org/abs/1105.4001
ID  - 1105.4001
ER  -