@misc{indiciae3708ad16d27e,
  title = {Mid-IR-laser microscopy as a tool for defect investigation in bulk semiconductors},
  author = {O. V. Astafiev and V. P. Kalinushkin and V. A. Yuryev},
  year = {2011},
  url = {https://arxiv.org/abs/1106.0751},
  note = {Source identifier: 1106.0751}
}