TY  - RPRT
TI  - Influence of photoexcitation depth on luminescence spectra of bulk GaAs single crystals: application to defect structure characterization
AU  - V. A. Yuryev
AU  - V. P. Kalinushkin
AU  - A. V. Zayats
AU  - Yu. A. Repeyev
AU  - V. G. Fedoseyev
PY  - 2011
UR  - https://arxiv.org/abs/1106.0753
ID  - 1106.0753
ER  -