@misc{indiciae0813582a5329,
  title = {Optical beam-induced scattering mode of mid-IR laser microscopy: a method for defect investigation in near-surface and near-interface regions of bulk semiconductors},
  author = {O. V. Astafiev and V. P. Kalinushkin and V. A. Yuryev},
  year = {2011},
  url = {https://arxiv.org/abs/1106.0754},
  note = {Source identifier: 1106.0754}
}