@misc{indiciae715ece5ef928,
  title = {Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded Self-Testing},
  author = {Diana Bodean and Ghenadie Bodean and Wajeb Gharibi},
  year = {2011},
  url = {https://arxiv.org/abs/1106.3677},
  note = {Source identifier: 1106.3677}
}