@misc{indiciae33e841dbf3c1,
  title = {Gate Bias Stress in Pentacene Field-Effect-Transistors: Charge Trapping in the Dielectric or Semiconductor},
  author = {Roger Häusermann and Bertram Batlogg},
  year = {2011},
  doi = {10.1063/1.3628297},
  url = {https://arxiv.org/abs/1106.4636},
  note = {Source identifier: 1106.4636}
}