TY  - RPRT
TI  - Gate Bias Stress in Pentacene Field-Effect-Transistors: Charge Trapping in the Dielectric or Semiconductor
AU  - Roger Häusermann
AU  - Bertram Batlogg
PY  - 2011
DO  - 10.1063/1.3628297
UR  - https://arxiv.org/abs/1106.4636
ID  - 1106.4636
ER  -