TY  - RPRT
TI  - Real-time Measurement of Stress and Damage Evolution During Initial Lithiation of Crystalline Silicon
AU  - Michael J. Chon
AU  - Vijay A. Sethuraman
AU  - Anthony McCormick
AU  - Venkat Srinivasan
AU  - Pradeep R. Guduru
PY  - 2011
DO  - 10.1103/physrevlett.107.045503
UR  - https://arxiv.org/abs/1107.5739
ID  - 1107.5739
ER  -