@misc{indiciaedbe495d0881d,
  title = {In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation},
  author = {Vijay A. Sethuraman and Michael J. Chon and Maxwell Shimshak and Venkat Srinivasan and Pradeep R. Guduru},
  year = {2011},
  doi = {10.1016/j.jpowsour.2010.02.013},
  url = {https://arxiv.org/abs/1108.0647},
  note = {Source identifier: 1108.0647}
}