TY  - RPRT
TI  - In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation
AU  - Vijay A. Sethuraman
AU  - Michael J. Chon
AU  - Maxwell Shimshak
AU  - Venkat Srinivasan
AU  - Pradeep R. Guduru
PY  - 2011
DO  - 10.1016/j.jpowsour.2010.02.013
UR  - https://arxiv.org/abs/1108.0647
ID  - 1108.0647
ER  -