TY  - RPRT
TI  - Investigation of the Novel Attributes of a Dual Material Gate Nanoscale Tunnel Field Effect Transistor
AU  - Sneh Saurabh
AU  - M. Jagadesh Kumar
PY  - 2011
DO  - 10.1109/ted.2010.2093142
UR  - https://arxiv.org/abs/1108.3148
ID  - 1108.3148
ER  -