TY  - RPRT
TI  - Ultrafast photocurrent measurement of the escape time of electrons and holes from carbon nanotube PN junction photodiodes
AU  - Nathaniel M. Gabor
AU  - Zhaohui Zhong
AU  - Ken Bosnick
AU  - Paul L. McEuen
PY  - 2011
DO  - 10.1103/physrevlett.108.087404
UR  - https://arxiv.org/abs/1109.0269
ID  - 1109.0269
ER  -