@misc{indiciaed05fab8a2f55,
  title = {Finite geometry models of electric field noise from patch potentials in ion traps},
  author = {Guang Hao Low and Peter F. Herskind and Isaac L. Chuang},
  year = {2011},
  url = {https://arxiv.org/abs/1109.2995},
  note = {Source identifier: 1109.2995}
}