TY  - RPRT
TI  - Finite geometry models of electric field noise from patch potentials in ion traps
AU  - Guang Hao Low
AU  - Peter F. Herskind
AU  - Isaac L. Chuang
PY  - 2011
UR  - https://arxiv.org/abs/1109.2995
ID  - 1109.2995
ER  -