TY  - RPRT
TI  - Characterization of Thin Pixel Sensor Modules Interconnected with SLID Technology Irradiated to a Fluence of 2$\cdot 10^{15}$\,n$_{\mathrm{eq}}$/cm$^2$
AU  - P. Weigell
AU  - L. Andricek
AU  - M. Beimforde
AU  - A. Macchiolo
AU  - H. -G. Moser
AU  - R. Nisius
AU  - R. -H. Richter
PY  - 2011
DO  - 10.1088/1748-0221/6/12/c12049
UR  - https://arxiv.org/abs/1109.3299
ID  - 1109.3299
ER  -