TY  - RPRT
TI  - Layer Number Determination and Thickness-dependent Properties of Graphene Grown on SiC
AU  - Wenjuan Zhu
AU  - Christos Dimitrakopoulos
AU  - Marcus Freitag
AU  - Phaedon Avouris
PY  - 2011
DO  - 10.1109/tnano.2011.2130536
UR  - https://arxiv.org/abs/1109.4397
ID  - 1109.4397
ER  -