TY  - RPRT
TI  - Electric breakdown effect in the current-voltage characteristics of amorphous indium oxide thin films near the superconductor-insulator transition
AU  - O. Cohen
AU  - M. Ovadia
AU  - D. Shahar
PY  - 2011
DO  - 10.1103/physrevb.84.100507
UR  - https://arxiv.org/abs/1109.4406
ID  - 1109.4406
ER  -