@misc{indiciaed274da26e8ca,
  title = {Defect detection in nano-scale transistors based on radio-frequency reflectometry},
  author = {B. J. Villis and A. O. Orlov and X. Jehl and G. L. Snider and P. Fay and M. Sanquer},
  year = {2011},
  doi = {10.1063/1.3647555},
  url = {https://arxiv.org/abs/1109.4545},
  note = {Source identifier: 1109.4545}
}