TY  - RPRT
TI  - Defect detection in nano-scale transistors based on radio-frequency reflectometry
AU  - B. J. Villis
AU  - A. O. Orlov
AU  - X. Jehl
AU  - G. L. Snider
AU  - P. Fay
AU  - M. Sanquer
PY  - 2011
DO  - 10.1063/1.3647555
UR  - https://arxiv.org/abs/1109.4545
ID  - 1109.4545
ER  -