TY  - RPRT
TI  - Electromigration occurrences and its effects on metallic surfaces submitted to high electromagnetic field : A novel approach to breakdown in accelerators
AU  - C. Antoine
AU  - F. Peauger
AU  - F. Le Pimpec
PY  - 2012
DO  - 10.1016/j.nima.2011.11.032
UR  - https://arxiv.org/abs/1110.0397
ID  - 1110.0397
ER  -