@misc{indiciaec98c6ace0a0d,
  title = {In Situ Imaging of the Conducting Filament in a Silicon Oxide Resistive Switch},
  author = {Jun Yao and Lin Zhong and Douglas Natelson and James M. Tour},
  year = {2011},
  doi = {10.1038/srep00242},
  url = {https://arxiv.org/abs/1110.3755},
  note = {Source identifier: 1110.3755}
}