TY  - RPRT
TI  - In Situ Imaging of the Conducting Filament in a Silicon Oxide Resistive Switch
AU  - Jun Yao
AU  - Lin Zhong
AU  - Douglas Natelson
AU  - James M. Tour
PY  - 2011
DO  - 10.1038/srep00242
UR  - https://arxiv.org/abs/1110.3755
ID  - 1110.3755
ER  -