TY  - RPRT
TI  - Temperature and thickness evolution and epitaxial breakdown in highly-strained BiFeO3 thin films
AU  - Anoop R. Damodaran
AU  - Sungki Lee
AU  - Karthik Jambunathan
AU  - Scott MacClaren
AU  - Lane W. Martin
PY  - 2011
DO  - 10.1103/physrevb.85.024113
UR  - https://arxiv.org/abs/1110.3847
ID  - 1110.3847
ER  -