@misc{indiciaefa4295857525,
  title = {Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-corrected STEM},
  author = {Huolin L. Xin and Ye Zhu and David A. Muller},
  year = {2012},
  doi = {10.1017/s1431927612000189},
  url = {https://arxiv.org/abs/1110.6700},
  note = {Source identifier: 1110.6700}
}