TY  - RPRT
TI  - Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-corrected STEM
AU  - Huolin L. Xin
AU  - Ye Zhu
AU  - David A. Muller
PY  - 2012
DO  - 10.1017/s1431927612000189
UR  - https://arxiv.org/abs/1110.6700
ID  - 1110.6700
ER  -