@misc{indiciaeb2ecc6f3c310,
  title = {Study of X-ray Radiation Damage in Silicon Sensors},
  author = {Jiaguo Zhang and Eckhart Fretwurst and Robert Klanner and Hanno Perrey and Ioana Pintilie and Thomas Poehlsen and Joern Schwandt},
  year = {2011},
  doi = {10.1088/1748-0221/6/11/c11013},
  url = {https://arxiv.org/abs/1111.1180},
  note = {Source identifier: 1111.1180}
}