TY  - RPRT
TI  - Study of X-ray Radiation Damage in Silicon Sensors
AU  - Jiaguo Zhang
AU  - Eckhart Fretwurst
AU  - Robert Klanner
AU  - Hanno Perrey
AU  - Ioana Pintilie
AU  - Thomas Poehlsen
AU  - Joern Schwandt
PY  - 2011
DO  - 10.1088/1748-0221/6/11/c11013
UR  - https://arxiv.org/abs/1111.1180
ID  - 1111.1180
ER  -