@misc{indiciae9a9f60808e27,
  title = {Emissivity measurements with an Atomic Force Microscope},
  author = {Pieter Jan van Zwol and Laurent Ranno and Joel Chevrier},
  year = {2011},
  doi = {10.1063/1.3697673},
  url = {https://arxiv.org/abs/1111.1193},
  note = {Source identifier: 1111.1193}
}