TY  - RPRT
TI  - Emissivity measurements with an Atomic Force Microscope
AU  - Pieter Jan van Zwol
AU  - Laurent Ranno
AU  - Joel Chevrier
PY  - 2011
DO  - 10.1063/1.3697673
UR  - https://arxiv.org/abs/1111.1193
ID  - 1111.1193
ER  -