TY  - RPRT
TI  - Effects of Interface Roughness Scattering on Radio Frequency Performance of Silicon Nanowire Transistors
AU  - SungGeun Kim
AU  - Mathieu Luisier
AU  - Timothy B. Boykin
AU  - Gerhard Klimeck
PY  - 2011
DO  - 10.1063/1.3665939
UR  - https://arxiv.org/abs/1111.3424
ID  - 1111.3424
ER  -