TY  - RPRT
TI  - Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations
AU  - J. Schwandt
AU  - E. Fretwurst
AU  - R. Klanner
AU  - I. Pintilie
AU  - J. Zhang
PY  - 2011
DO  - 10.1088/1748-0221/7/01/c01006
UR  - https://arxiv.org/abs/1111.4901
ID  - 1111.4901
ER  -