@misc{indiciae109a7dd8fe59,
  title = {Electrical Characterization of SiPM as a Function of Test Frequency and Temperature},
  author = {M. J. Boschini and C. Consolandi and P. G. Fallica and M. Gervasi and D. Grandi and M. Mazzillo and S. Pensotti and P. G. Rancoita and D. Sanfilippo and M. Tacconi and G. Valvo},
  year = {2012},
  doi = {10.1142/9789814405072\_0099},
  url = {https://arxiv.org/abs/1112.0107},
  note = {Source identifier: 1112.0107}
}