@misc{indiciae5549f40dab5b,
  title = {Automatic post-picking improves particle image detection from Cryo-EM micrographs},
  author = {Ramin Norousi and Stephan Wickles and Thomas Becker and Roland Beckmann and Volker J. Schmid and Achim Tresch},
  year = {2012},
  doi = {10.1016/j.jsb.2013.02.008},
  url = {https://arxiv.org/abs/1112.3173},
  note = {Source identifier: 1112.3173}
}