TY  - RPRT
TI  - Automatic post-picking improves particle image detection from Cryo-EM micrographs
AU  - Ramin Norousi
AU  - Stephan Wickles
AU  - Thomas Becker
AU  - Roland Beckmann
AU  - Volker J. Schmid
AU  - Achim Tresch
PY  - 2012
DO  - 10.1016/j.jsb.2013.02.008
UR  - https://arxiv.org/abs/1112.3173
ID  - 1112.3173
ER  -