TY  - RPRT
TI  - Instability of Amorphous Oxide Semiconductors via Carrier-Mediated Structural Transition between Disorder and Peroxide State
AU  - Ho-Hyun Nahm
AU  - Yong-Sung Kim
AU  - Dae Hwan Kim
PY  - 2011
UR  - https://arxiv.org/abs/1112.4914
ID  - 1112.4914
ER  -